Applications and Metrology at Nanometer-Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
by Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
ISBN 13: 9781786306401
Format: Hardcover Publisher: Wiley-ISTE Published: 17 May 2021
Save for later
Les systèmes mécatroniques embarqués: Tome 1, Analyse des causes de défaillances, fiabilité et contraintes
by Abdelkhalak El Hami, Philippe Pougnet
ISBN 13: 9781784056469
Format: Paperback Publisher: ISTE éditions Published: 28 May 2020