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Applications and Metrology at Nanometer-Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

by Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

ISBN 13: 9781786306401

Format: Hardcover
Publisher: Wiley-ISTE
Published: 17 May 2021

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Les systèmes mécatroniques embarqués: Tome 1, Analyse des causes de défaillances, fiabilité et contraintes

by Abdelkhalak El Hami, Philippe Pougnet

ISBN 13: 9781784056469

Format: Paperback
Publisher: ISTE éditions
Published: 28 May 2020

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